FISCHERSCOPE® X-RAY XDAL® Measuring Instruments
FISCHERSCOPE® X-RAY XDAL® Measuring Instruments
SKU:FIS-53c041
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FISCHERSCOPE® X-RAY XDAL® Measuring Instruments
$49.99
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FISCHERSCOPE® X-RAY XDAL® Measuring Instruments
$49.99
Quantity: 1
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In its design, the FISCHERSCOPE® X-RAY XDAL® measurement system corresponds to the XDLM. The difference is in the type of detector. With the XDAL®, a Peltier-cooled silicon PIN detector is used with an energy resolution that is significantly better than that of the proportional counter tube used in the XDLM®. This instrument is, therefore, suited for general materials analysis, trace analysis and for measurement of thin coatings.
Product Specifications
Additional Information
The X-ray source is a micro-focus tube that can resolve small target areas. However, due to the relatively small active detector area (as compared to the proportional counter tube), the XDAL® has only limited suitability for very small structures or measurement spots because only low intensities are measured. Similar to the XDLM®, apertures and filters can be changed automatically in order to create the optimum excitation conditions for different measuring applications.The FISCHERSCOPE® X-RAY XDAL® has a large measurement chamber which accommodates specimens with complex geometries. The motor-driven, adjustable Z-axis allows for sample heights of up to 140 mm. For large, flat samples such as PC Boards, the housing has openings on the side (C-slot).The measuring system is equipped with a fast, programmable XY-stage, so surfaces can be examined easily in the mapping mode. Also, serial measurements on components, e.g. lead frames, or the measurement of multiple and varied components can be quickly programmed and executed automatically.Because the XY-stage travels automatically to the loading position when the hood is opened (pop-out function), quick positioning of the sample is simple. A laser pointer shows the measuring position on the specimen.Examples from practical applicationsThe FISCHERSCOPE® X-RAY XDAL® is used to determine Pb in tin-lead solder coatings. In this application, the thickness of the SnPb coating must be determined correctly in order to analyze the concentration of Pb. For "high reliability" applications in the aeronautics and space industry, the alloy Pb content must be at least 3% to avoid the formation of whiskers.On the other hand, for electronics products in daily use, the RoHS standard applies, which restricts the Pb content of the solder to a maximum of 1000 ppm. Although the detection limit for Pb in solder coatings with the XDAL® depends on the thickness, it is usually sufficiently low that both requirements are easily met by the XDAL®.
Characteristics
Micro-focus X-ray tube with W-anode and beryllium window. Maximum operating conditions: 50 kV, 50 WPeltier-cooled silicon PIN diode as X-ray detectorProgrammable XY-stageVideo camera for optical observation of the measurement location along the axis of the primary X-ray beam. Crosshairs with calibrated scale (ruler) and display of the measurement spotDesign-approved, fully protected instrument compliant with the German X-ray ordinance § 4 Para. 3
Specifications Adjustable Measuring Distance
0 to 80 mm
Specifications Aperture
4-X Automatically Exchangeable
Specifications Aperture Diameter
0.1 to 0.6 mm
Specifications Intended Application
Coating Thickness | Material Analysis
Specifications Maximum Operating Power
50 W
Specifications Maximum Operating Voltage
50 kV
Specifications Primary Filter
3-X Automatically Exchangeable
Fields Of Application
Materials analysis of coatings and alloys (also thin coatings and low concentrations) Incoming goods inspection, manufacturing monitoringResearch and developmentElectronics industryConnectors and contactsGold, jewelry and watch industriesMeasurement of thin Au and Pd coatings of only a few nanometers in printed circuit board manufacturingTrace analysisDetermination of lead (Pb) for "high reliability" applicationsAnalysis of hard material coatings