FISCHERSCOPE® X-RAY XDV®-SDD Measuring Instruments
FISCHERSCOPE® X-RAY XDV®-SDD Measuring Instruments
SKU:FIS-b4d168
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FISCHERSCOPE® X-RAY XDV®-SDD Measuring Instruments
$49.99
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FISCHERSCOPE® X-RAY XDV®-SDD Measuring Instruments
$49.99
Quantity: 1
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The FISCHERSCOPE® X-RAY XDV®-SDD features a silicon drift detector with a large sensitive area and good energy resolution. When combined with large apertures, very high count rates can be realized, producing excellent repeatability precision and very low detection limits. The XDV®-SDD is particularly well suited for measuring the thinnest of coatings for trace analysis. The improved sensitivity for X-radiation with low energy also expands the range of measurable elements down to lower atomic numbers, enabling, for example, the reliable measurement of phosphorous or aluminum in air.In order to create ideal excitation conditions for every measurement, the XDV®-SDD features exchangeable apertures and primary filters.
Product Specifications
Additional Information
With its large and easily accessible measurement chamber, the XDV®-SDD can accommodate flat, plane objects as well as larger specimens with complex shapes. Serial tests or measurements of coating thickness and element distribution are made simple with the fast, programmable XY-stage.User-friendly operation, a wide-opening hood and control elements located on the front of the device facilitate the day-to-day use of this instrument.The precise definition of the measurement location is simplified by a high-resolution, high magnification video camera, which accurately displays the measurement position during operation. A laser pointer acting as a positioning aid further facilitates the quick orientation of the samples.Its performance capabilities and universal design make the XDV®-SDD ideal for research and development, process qualifying, and laboratories. It is also indispensable in quality assurance and in production monitoring, due to its robust design and user-friendliness.Examples from practical applicationsLegal regulations strictly limit the concentration of various harmful substances, for example in electronics, toys or packaging. The XDV®-SDD makes it possible to quickly and easily monitor compliance with these limits. For example, the especially critical chemical elements Pb, Hg and Cd can be measured with detection limits of just a few ppm in plastics.
Characteristics
Micro-focus X-ray tube with W-anode and beryllium window.Peltier-cooled silicon drift detector as the X-ray detectorProgrammable XY-stage with pop-out function Video camera for optical monitoring of the measurement location along the axis of the primary X-ray beam. Crosshairs with calibrated scale (ruler) and display of the measurement spot Design-approved, fully protected instrument compliant with the German X-ray ordinance § 4 Para. 3
Specifications Aperture
4-x Exchangeable
Specifications Aperture Diameter
0.1 to 3 mm
Specifications Intended Application
Coating Thickness | Material Analysis
Specifications Maximum Operating Power
50 W
Specifications Maximum Operating Voltage
50 kV
Specifications Primary Filter
6-x Exchangeable
Fields Of Application
Inspection of very thin coatings, e.g. in the electronics and semiconductor industriesTrace analysis, e.g. detection of harmful substances according to RoHS, toy standards, packaging standardsGold and precious metal analysis with highest precisionPhotovoltaic industryMeasurement of thickness and composition of NiP-layers