Advanced Nanopositioning System with Parallel Metrology
Advanced Nanopositioning System with Parallel Metrology
SKU:NAN-274ea8
Achieve nanometer precision with our advanced Multi-Axis Nanopositioning Stages featuring Parallel Metrology. Ideal for critical applications in microscopy, semiconductor metrology, and optics.
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Advanced Nanopositioning System with Parallel Metrology
$3,999.99
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Advanced Nanopositioning System with Parallel Metrology
$3,999.99
Quantity: 1
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Experience unparalleled precision and control with our Multi-Axis, Piezo Nanopositioning / Scanning Tables featuring Parallel-Kinematics/Metrology for enhanced responsiveness. These stages offer nanometer precision ideal for critical applications in microscopy, semiconductor metrology, optics, and laser technology. Driven by high-performance piezoelectric stack actuators, they deliver high velocity, accuracy, and fast acceleration, making them perfect for optical alignment and scanning needs. The included computer control and programming options ensure seamless integration for advanced motion control.
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