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DUALSCOPE® DMP20 Coating Thickness Measurement Instrument

DUALSCOPE® DMP20 Coating Thickness Measurement Instrument

SKU:MOD-d2ca90

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Regular price $49.99
Regular price Sale price $49.99
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DUALSCOPE® DMP20 Coating Thickness Measurement Instrument

DUALSCOPE® DMP20 Coating Thickness Measurement Instrument

$49.99

Quantity: 1

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DUALSCOPE® DMP20 Coating Thickness Measurement Instrument

DUALSCOPE® DMP20 Coating Thickness Measurement Instrument

$49.99

Quantity: 1

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Robust and powerful hand-held instrument for coating thickness measurement on ferrous substrates according to the magnetic inductive (DIN EN ISO 2178) and on non-ferrous metals according to the eddy current method (DIN EN ISO 2360); (ASTMD7091) with exchangeable probes. Supports the FPR1 profile probe for determining the depth of surface profiles according to ASTM 4471.

Product Specifications

Additional Information
The portable FMP20 represent precise measurement technology and are ideal for samples and control measurement. These user-friendly and sturdy instruments can be adapted to all requirements of coating thickness measurement using exchangeable measuring probes. The most significant statistical values are displayed and can be stored together with the calibration in the instrument, ensuring quick and reliable operation.
Features
The portable FMP20 represent precise measurement technology and are ideal for samples and control measurement. These user-friendly and sturdy instruments can be adapted to all requirements of coating thickness measurement using exchangeable measuring probes. The most significant statistical values are displayed and can be stored together with the calibration in the instrument, ensuring quick and reliable operation.
Specifications Industry Standardscertifications
European Standards International Organization for Standardization (DIN EN ISO 2178) | European Standards International Organization for Standardization (DIN EN ISO 2360)
Specifications Intended Application
Coating Thickness
Specifications Interfaces
Universal Serial Bus (USB-C)
Specifications Measurement Method
Ferrous substrates according to the magnetic inductive and on non-ferrous metals according to the eddy current method.
Specifications Memory Readings
0 to 10000
Specifications Probes
Exchangeable
Specifications Storable Measuring Applications
1