FISCHERSCOPE® HM2000 Measuring Systems
FISCHERSCOPE® HM2000 Measuring Systems
SKU:FIS-137d55
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FISCHERSCOPE® HM2000 Measuring Systems
$49.99
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FISCHERSCOPE® HM2000 Measuring Systems
$49.99
Quantity: 1
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FISCHERSCOPE® HM2000 is a professional measurement instrument for the analysis of mechanical and elastic properties of materials by means of nanoindentation. Its very rigid and dimensionally stable construction reduces the influence of vibrations and fluctuations in temperature. Constant measurement conditions make it ideal for demanding measurement tasks in research and industrial applications. Moreover, its semi-automatic measurement procedures make it ideal for serial testing.
Product Specifications
Additional Information
Fischerscope® HM2000 is an automated nanoindentation Measuring Systems.
Applications
Characterization of surfaces in research and development, for example hard chrome or ceramic coatings on medical implantsHardness testing on complex geometries, such as casingsSerial testing of mass-produced parts in electroplatingQuality assurance of circuit boards, for example testing of the resistance of thin gold coatings or control of insulating layersTesting the toughness and strength of metal foilsMeasurement of properties determining wear, such as the hardness and strength of PVD or CVD coatings and hard materials, for example TiN, CrN and TiAIN coatingsMechanical, elastic and plastic properties of thin DLC coatingsMeasurement of the hardness and elasticity of paint coatings, for example automotive paint finishesTesting the mechanical properties of thin anodized layers (hard anodizing)Proving the scratch and abrasion resistance of coatingsAutomated measurements on multiple samples
Features
Determination of numerous plastic and elastic properties such as indentation hardness (convertible into Vickers hardness), modulus of indentation and creepModular construction enables flexible adaptation to customer-specific requirements, even retroactivelyMeasuring head suitable for the measurement of creep at constant temperatures over several hoursMicroscope with three magnification levels for exact positioning of the measuring spotAutonomous, highly accurate determination of zero level with fast forwardingProgrammable XY-table for automatic testing of numerous measuring pointsQuickly evaluate and clearly present your measurement results with high-performance WIN-HCU software
Optional Accessories
Enclosed measurement chamber to avoid external influences such as air streams from air conditioning unitsActive damping table to reduce vibration influencesHeatable sample overlays for material testing at increased temperaturesAtomic force microscope (AFM): record the three-dimensional surface of your sample and measure additional material parameters such as frictional propertiesHigh-precision positioning table for positioning accuracy to < 500 nmMore powerful microscope with autofocus and automatic object recognitionSpecimen holders for different samples
Specifications Indenters
Berkovich | Carbide Ball | Vickers
Specifications Measurement And Computation Of Material Parameter
American Society for Testing and Materials (ASTM E 2546) | European Standards International Organization for Standardization (DIN EN ISO 14577-1)