FISCHERSCOPE® X-RAY 5000 Measuring Systems
FISCHERSCOPE® X-RAY 5000 Measuring Systems
SKU:FIS-a89cf5
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FISCHERSCOPE® X-RAY 5000 Measuring Systems
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FISCHERSCOPE® X-RAY 5000 Measuring Systems
$49.99
Quantity: 1
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The FISCHERSCOPE® X-RAY 5000 series is specifically designed as a flange measuring head for integration into a production line. It is ideally suited for continuous, non-destructive inline analyses of alloys and the measurement of thin coatings on large-area products directly in an on-going production process. In contrast to the X-RAY 4000 series, the X-RAY 5000 does without changers for filter and aperture and without a camera system, because these are often unnecessary for objects with large surface area.The X-RAY 5000 can be customized for the purpose at hand: X-ray source, primary filter and semiconductor detector can be adapted optimally to suit the intended application.The measurements can be carried out in air or in vacuum. As an option, the flange can also be supplied in a water-cooled design, which makes performing measurements even on very hot substrate materials (surface temperatures up to 500 ºC) unproblematic.
Product Specifications
Additional Information
Depending on the design, measuring distances between 60 and 150 mm can be selected: Under certain circumstances, distance fluctuations of up to one centimeter, for example caused by wavy specimens, may be compensated for during the measurement using the WinFTM software.Calibration is quickly and easily completed on a workpiece master directly in the production process. Extensive calibration of the pure element library - as with the bench-top instruments - is possible but not necessary. The repeatability precision of the X-RAY 5000 instruments is excellent due to its large apertures, state-of-the art semiconductor detectors and digital pulse processor. The instrument's outstanding long-term stability also drastically reduces the need for re-calibration, saving time and resources.The FISCHERSCOPE® X-RAY 5000 measuring head has a very compact design and can be integrated directly into production lines using a standardized flange. The entire mechanical design is focused on maximum robustness and serviceability. For example, the instrument can be serviced while operating in a production line under vacuum, without having to break the vacuum.To integrate the X-RAY 5000 measurement system into a superordinate process control system, open interfaces according to industry standards, e.g. OPC, are available.
Characteristics
X-ray tube with W-anode and glass window or micro-focus X-ray tube with W-anode and beryllium window, optional Rh or Mo-anode.Peltier-cooled silicon PIN diode or Silicon drift detector as X-ray detector
Examples From Practical Applications
In the solar industry, for example, the FISCHERSCOPE® X-RAY 5000 determines the thickness and composition of CIGS, CIS, or CdTe coatings on different substrate materials such as glass, metal or plastic.
Specifications Aperture Diameter With Solid State Drive Ssd
11 mm
Specifications Fixed Aperture Diameter
1 mm | 2 mm | 4 mm | 8 mm
Specifications Maximum Operating Power
50 W
Specifications Maximum Operating Voltage
50 kV
Specifications Measuring Distance
60 to 100 | 100 to 150
Specifications Primary Filter
Fixed
Specifications Surface Temperature
0 to 500 ºC
Fields Of Application
Photovoltaics (CIGS, CIS, CdTe)Analysis of thin coatings on metal strip, metal foils and plastic filmsContinuous productionProcess monitoring of sputter and electroplating production linesLarge-area measurement