FISCHERSCOPE® X-RAY XAN® Measuring Instruments
FISCHERSCOPE® X-RAY XAN® Measuring Instruments
SKU:FIS-7fec30
N/A
Regular price
$49.99
Regular price
Sale price
$49.99
Unit price
per
Initiate Order
FISCHERSCOPE® X-RAY XAN® Measuring Instruments
$49.99
Quantity: 1
Claim Your Seller Account
FISCHERSCOPE® X-RAY XAN® Measuring Instruments
$49.99
Quantity: 1
Delivery via Maden
Expect your order to arrive on time.
Secure Payments
All orders are processed through a secure, PCI-compliant checkout.
In their various configurations, the instruments of the FISCHERSCOPE® X-RAY XAN® family cover a very wide range of applications. Their particular strength lies in quick and precise materials analysis and user-friendly handling, for e.g. the analysis of precious metal and gold alloys. The instruments are also useful in the analysis of thin coatings in the electronics and PC Board industries.
Product Specifications
Additional Information
All models have in common the geometric arrangement of their hardware components. X-ray source and detector are located below the measurement chamber. The measurement is carried out from bottom to top.This allows for fast and easy positioning of the samples. The instruments of the XAN® family are available in several versions that differ with regard to X-ray tubes, detectors, number of apertures and filters. Therefore, the XAN® family offers optimized solutions for various applications and accuracy requirements while delivering excellent cost-effectiveness.The assortment of XAN® instruments also includes models with both hardware and software specially designed to meet the unique requirements of the jewelry industry and the gold trade.Examples from practical applicationsInstruments with different types of detectors are used for the analysis of gold alloys. For example, the XAN® 310, which is equipped with an inexpensive proportional counter tube detector, is ideal for analyzing simple gold alloys with only a few elements, such as yellow gold alloys with Au, Ag and Cu. However, if alloys with many elements or overlapping fluorescence peaks are to be measured, then semiconductor detectors are better suited, as in the XAN® 315 or XAN® 220. With their significantly better resolution, they also enable the separation of, for example, gold and platinum, which is critical in the analysis of dental alloys and fused precious metal alloys.For laboratories and testing institutes, the XAN® 250 offers a silicon drift detector (SDD), an exchangeable six position filter, and four different apertures for accommodating a wide variety of applications. With this instrument, the repeatability precision for Au is below 0.5 %, and accuracies compared to cupellation can be achieved.
Characteristics
X-ray tube with W-anode and glass window or micro-focus X-ray tube with W-anode and beryllium window.Proportional counter tube, silicon PIN diode or Silicon drift detector as X-ray detectorFixed sample supportVideo camera for optical observation of the measurement location along the axis of the primary X-ray beam. Cross hairs with calibrated scale (ruler) and display of the measurement spotDesign-approved, fully protected instrument compliant with the German X-ray ordinance § 4 Para. 3
Specifications Aperture
4-X Automatically Exchangeable | Fixed
Specifications Aperture Diameter
0.2 to 2 mm
Specifications Intended Application
Coating Thickness | Material Analysis
Specifications Maximum Operating Power
50 W
Specifications Maximum Operating Voltage
50 kV
Specifications Primary Filter
3-X Exchangeable | 6-X Automatically Exchangeable | Fixed
Fields Of Application
Gold and precious metal analysis in the jewelry and watch industriesMeasurement of thin coatings of only a few nanometers, such as Au and Pd on printed circuit boards and electronics componentsTrace analysis (e.g. harmful substances in electronic components (RoHS) or tools)Analysis of light elements such as Al, Si, P with the XAN® 250General materials analysis and coating thickness measurement in laboratories, testing institutions and universities