High-Frequency QFP/SOP Test Socket - JCC GGT18 Series
High-Frequency QFP/SOP Test Socket - JCC GGT18 Series
SKU:TES-097e26
Enhance IC testing with JCC GGT18 Series High-Frequency Socket. Exceeds 40 GHz for reliable performance on QFP/SOP devices.
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$129.99
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High-Frequency QFP/SOP Test Socket - JCC GGT18 Series
$129.99
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High-Frequency QFP/SOP Test Socket - JCC GGT18 Series
$129.99
Quantity: 1
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The JCC GGT18 Series High-Frequency TK Elastomer Conductive Sheet Socket is a premium solution for System Level Testing of Quad-Flat Package (QFP) and Small Outline Package (SOP) devices. With a frequency range exceeding 40 GHz, this Separated Lid socket ensures reliable, high-frequency performance for Integrated Circuit (IC) testing. Its advanced design guarantees precise results while maintaining durability for prolonged usage. Trusted by leading institutions, this socket streamlines testing processes and enhances overall efficiency in semiconductor testing.
Product Specifications
Features
High-frequency characteristics
Specifications Frequency
>40 GHz
Specifications Type
Separated Lid