High-Speed Nanofocusing Z-Stages with Direct Metrology
High-Speed Nanofocusing Z-Stages with Direct Metrology
SKU:NAN-59b217
Achieve sub-nm precision with our high-speed Nanofocusing Z-Stages for advanced surface metrology and microscopy applications.
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High-Speed Nanofocusing Z-Stages with Direct Metrology
$1,299.99
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High-Speed Nanofocusing Z-Stages with Direct Metrology
$1,299.99
Quantity: 1
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Experience unparalleled precision with our PIFOC® Long-Range Nanofocusing Z-Stages equipped with Direct Metrology technology. Achieve sub-nanometer resolution, high linearity, and stability for surface metrology, laser processing, and high-resolution microscopy. With features like fast response time, frictionless precision flexure guiding system, and compatibility with Metamorph⢠Imaging Software, these stages are ideal for ultra-fast and high-precision autofocusing systems. Drive your research further with our reliable PICMA® piezo stacks and computer-optimized flexure guiding system.
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