PICODENTOR® HM500 Measuring Systems
PICODENTOR® HM500 Measuring Systems
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PICODENTOR® HM500 Measuring Systems
$49.99
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PICODENTOR® HM500 Measuring Systems
$49.99
Quantity: 1
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PICODENTOR® HM500 is Fischer's highest performance indentation measurement instrument. Normally, only very elaborate and extremely costly measurement instruments offer similarly high resolution and the corresponding accuracy of force and travel measurement. By contrast, PICODENTOR® HM500 combines high-end technology with simple operation. A programmable XY-table, which allows positioning of the samples with an accuracy of < 0.5 µm, makes it suitable for demanding measurement tasks such as the automatic analysis of extremely small measurement areas. The bundled WIN-HCU software not only enables intuitive use of the measurement instruments, it also allows fast and simple determination of numerous material parameters and the dynamic mechanical analysis for small samples.
Product Specifications
Additional Information
The PICODENTOR® HM500 is an automated nanoindentation measuring system.
Applications
Measurements on extremely small sample areasAnalysis of ion-implanted surfacesTesting of nano layers with sensorsMatrix effects in alloysMeasurement of biological materialsDetermination of the plastic and elastic properties on cross-sectionsDynamic mechanical analysis for small samplesAccurate long-term measurementMeasurement of the hardness of bonding wires in the semiconductor industryDetermination of the abrasion resistance and bond ability of connectorsMechanical protective coating such as hardness, elasticity and scratch-resistance of multi-layered protective coating on optical glasses and lensesMeasurement of the hardness and elasticity of PVD, CVD and DLC coatings, as well as chemical nickel layersAutomated measurements on multiple samplesProving the scratch and abrasion resistance of coatings
Features
Determination of numerous plastic and elastic properties such as indentation hardness (convertible into Vickers hardness), modulus of indentation and creepExcellent temperature stabilityDynamic Mode with oscillating force applicationCustomer-specific indenters on requestMicroscope with three magnification levels and autofocus for exact positioning of the measuring spotAutonomous, highly accurate determination of zero level with fast forwardingProgrammable XY-precision table (accuracy ≤ 0.5 µm), active damping tableAvailable as an attractive entry-level model (the Light version) with predefined features and positioning accuracy up to ≤ 2 µmQuickly evaluate and clearly present your measurement results with high-performance WIN-HCU software
Optional Accessories
Heating table SHS200 for tests at raised temperaturesAtomic force microscope (AFM): record the three-dimensional surface of your sample and measure additional material parameters such as frictional propertiesSpecimen holders for different samplesSound insulation casing to minimize acoustic influences while measuring at very low loads
Specifications Indenters
Berkovich | Carbide Ball | Vickers
Specifications Measurement And Computation Of Material Parameter
American Society for Testing and Materials (ASTM E 2546) | European Standards International Organization for Standardization (DIN EN ISO 14577-1)
Specifications Positioning Accuracy
≤ 0.5 µm
Specifications Positioning Accuracy Light Version
Up to ≤ 2 µm