Precision Nanopositioning XY Tables with Metrology
Precision Nanopositioning XY Tables with Metrology
SKU:NAN-eaa027
Achieve nano-precision with our XY Tables for surface analysis and microscopy applications. Enhanced responsiveness and automatic runout compensation ensure optimal performance.
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Precision Nanopositioning XY Tables with Metrology
$1,499.99
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Precision Nanopositioning XY Tables with Metrology
$1,499.99
Quantity: 1
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The Precision Nanopositioning XY Tables with Parallel Metrology are engineered for ultra-precision trajectory control, ideal for surface analysis and scanning microscopy applications. With flatness in the low nanometer range, parallel-kinematics/metrology technology ensures enhanced responsiveness and automatic runout compensation. Featuring a 100 x 100 µm travel range and direct-metrology capacitive sensors for higher precision, these tables boast a 56 x 56 mm clear aperture and utilize PICMA® high-performance multilayer piezo drives. Designed for surface metrology applications with minimal out-of-plane motion, these 2-axis nanopositioners are compatible with computer control via the E-727 multi-axis controller series, offering seamless integration with LabView and MatLab systems.
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